Hi zusammen.
Ich kann aufeinmal meine Partition nicht mehr mounten.
Ist die Festplatte in meinem Server. Die Platte ist in Systempartition, Swap und ne
Datenpartition aufgeteilt. System und Swap gehen normal nur die Datenpartition /dev/hda6
läst sich nicht mehr mounten.
Kommt immer folgender Fehler:
smartctl -a /dev/hda6 sagt:Code:mount: Falscher Dateisystemtyp, ungültige Optionen, der »Superblock« von /dev/hda6 ist beschädigt oder es sind zu viele Dateisysteme eingehängt
Ich habe die Partition schon komplett gelöscht und neu formatiert aber keine Änderung.Code:=== START OF INFORMATION SECTION === Device Model: SAMSUNG SP1614N Serial Number: S016J10X720232 Firmware Version: TM100-24 Device is: In smartctl database [for details use: -P show] ATA Version is: 7 ATA Standard is: ATA/ATAPI-7 T13 1532D revision 0 Local Time is: Tue Sep 28 20:27:31 2004 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (5760) seconds. Offline data collection capabilities: (0x1b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 96) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000b 100 100 051 Pre-fail Always - 1 3 Spin_Up_Time 0x0007 253 253 000 Pre-fail Always - 0 4 Start_Stop_Count 0x0032 253 253 000 Old_age Always - 0 5 Reallocated_Sector_Ct 0x0033 253 253 010 Pre-fail Always - 0 7 Seek_Error_Rate 0x000b 253 253 051 Pre-fail Always - 0 8 Seek_Time_Performance 0x0024 253 253 000 Old_age Offline - 0 9 Power_On_Half_Minutes 0x0032 100 100 000 Old_age Always - 974h+41m 10 Spin_Retry_Count 0x0013 253 253 049 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 253 253 000 Old_age Always - 0 194 Temperature_Celsius 0x0022 115 097 000 Old_age Always - 41 195 Hardware_ECC_Recovered 0x000a 100 100 000 Old_age Always - 15616491 196 Reallocated_Event_Count 0x0012 253 253 000 Old_age Always - 0 197 Current_Pending_Sector 0x0033 253 253 010 Pre-fail Always - 0 198 Offline_Uncorrectable 0x0031 253 253 010 Pre-fail Offline - 0 199 UDMA_CRC_Error_Count 0x000b 253 253 051 Pre-fail Always - 0 200 Multi_Zone_Error_Rate 0x000b 100 100 051 Pre-fail Always - 0 201 Soft_Read_Error_Rate 0x000b 100 100 051 Pre-fail Always - 0 SMART Error Log Version: 1 ATA Error Count: 2 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 2 occurred at disk power-on lifetime: 953 hours (39 days + 17 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 04 51 00 00 4f c2 e0 Error: ABRT Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- b0 da 00 00 4f c2 e0 00 11d+04:08:23.688 SMART RETURN STATUS 20 00 08 97 30 10 e1 00 11d+04:08:23.688 READ SECTOR(S) 20 00 08 b7 00 10 e1 00 11d+04:08:23.688 READ SECTOR(S) 20 00 40 e7 88 5c e0 00 11d+04:08:23.625 READ SECTOR(S) ec 00 00 e6 88 5c e0 00 11d+04:08:23.625 IDENTIFY DEVICE Error 1 occurred at disk power-on lifetime: 953 hours (39 days + 17 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 04 51 00 00 4f c2 e0 Error: ABRT Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- b0 da 00 00 4f c2 e0 00 11d+03:34:09.125 SMART RETURN STATUS 20 00 08 97 30 10 e1 00 11d+03:34:09.125 READ SECTOR(S) 20 00 08 b7 00 10 e1 00 11d+03:34:09.125 READ SECTOR(S) 20 00 08 d7 2f 10 e1 00 11d+03:34:09.125 READ SECTOR(S) 20 00 40 e7 88 5c e0 00 11d+03:34:09.125 READ SECTOR(S) SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] Device does not support Selective Self Tests/Logging
Kann mir da wer weiterhelfen?
Ist ziemlich ärgerlich, da die Platte erst einen Monat alt ist.
bye
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Zitat von |sXe|
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